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|Title:||A template-based technique for efficient Clifford+T-based quantum circuit implementation||Authors:||Biswal, Laxmidhar
|Keywords:||Engineering::Computer science and engineering||Issue Date:||2018||Source:||Biswal, L., Das, R., Bandyopadhyay, C., Chattopadhyay, A., & Rahaman, H. (2018). A template-based technique for efficient Clifford+T-based quantum circuit implementation. Microelectronics Journal, 81, 58-68. doi:10.1016/j.mejo.2018.08.011||Journal:||Microelectronics Journal||Abstract:||The near-future possibility of Quantum supremacy, which aspires to establish a set of algorithms running efficiently on a Quantum computer – have significantly fuelled the interest in design and automation of Quantum circuits. Multiple technologies such as Ion-Trap, Nuclear Magnetic Resonance (NMR), have made great progress in recent years towards a practical Quantum circuit implementation. For all these technologies, in order to suppress the inherent computation noise, fault-tolerance is a desirable feature. Fault tolerance is achieved by Quantum error correction codes, such as surface code. Due to the efficient realization of surface codes using Clifford + T gate library of Quantum logic gates, it is now becoming de facto gate library for Quantum circuit implementation. In this paper, we improve two key performance metrics, T − depth and T − count, for Quantum circuit realization using Clifford + T gates. In contrast with the previous approaches, we have incorporated two techniques - 1) restructuring of the gate positions in the designs to make it amenable towards a lower T − depth 2) using Binary Decision Diagrams (BDD) as an intermediate representation for achieving scalability. To validate our proposed optimizations, we have tested a wide spectrum of benchmarks, registering an average improvement of 74% and 21% on T − depth and T − count in compared works.||URI:||https://hdl.handle.net/10356/139091||ISSN:||0026-2692||DOI:||10.1016/j.mejo.2018.08.011||Rights:||© 2018 Elsevier Ltd. All rights reserved.||Fulltext Permission:||none||Fulltext Availability:||No Fulltext|
|Appears in Collections:||SCSE Journal Articles|
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