Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/139453
Title: Scanning optical microscopy for porosity quantification of additively manufactured components
Authors: Wang, Pan
Tan, Xipeng
He, Chaoyi
Nai, Sharon Mui Ling
Huang, Ruoxuan
Tor, Shu Beng
Wei, Jun
Keywords: Engineering::Mechanical engineering
Issue Date: 2018
Source: Wang, P., Tan, X., He, C., Nai, S. M. L., Huang, R., Tor, S. B., & Wei, J. (2018). Scanning optical microscopy for porosity quantification of additively manufactured components. Additive Manufacturing, 21, 350-358. doi:10.1016/j.addma.2018.03.019
Journal: Additive Manufacturing
Abstract: Electron beam melting (EBM) is a representative powder-bed fusion additive manufacturing technology, which is suitable for producing near-net-shape metallic components with complex geometries and near-full densities. However, various types of pores are usually present in the additively manufactured components. These pores may affect mechanical properties, particularly the fatigue properties. Therefore, inspection of size, quantity and distribution of pores is critical for the process control and assessment of additively manufactured components. Here, we propose a method to quantify the pore size distribution and porosity of additively manufactured components by utilizing scanning optical microscopy. The advantages and limitations of the developed method are discussed based on the comparison study between Archimedes method, conventional optical microscopy and x-ray computed tomography. It is revealed that the new method exhibits the advantages of high precision (∼ 1.75 μm), more information, high repeatability and low time consumption (20 min/per sample). This provides a new metrology for measurement of not only pores but also micro-cracks, which are the common defects in additively manufactured components.
URI: https://hdl.handle.net/10356/139453
ISSN: 2214-8604
DOI: 10.1016/j.addma.2018.03.019
Rights: © 2018 Elsevier B.V. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:SIMTech Journal Articles

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