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https://hdl.handle.net/10356/139733
Title: | A 0.013-mm2 0.53-mW/Gb/s 32-Gb/s hybrid analog equalizer under 21-dB channel loss in 65-nm CMOS | Authors: | Balachandran, Arya Chen, Yong Boon, Chirn Chye |
Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2017 | Source: | Balachandran, A., Chen, Y., & Boon, C. C. (2018). A 0.013-mm2 0.53-mW/Gb/s 32-Gb/s hybrid analog equalizer under 21-dB channel loss in 65-nm CMOS. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 26(3), 599-603. doi:10.1109/TVLSI.2017.2771429 | Journal: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems | Abstract: | Low-power and low-jitter equalization techniques become increasingly crucial for the wire-line receivers operating at data rates more than tens of gigabits per second. This brief reports an inductorless and power-efficient 32-Gb/s hybrid analog equalizer. The hybrid analog equalizer utilizes a triple-gate control to achieve equalization over a range of channel loss resulting in an inductorless and area-efficient design. The triple-gate controls entail that a low-frequency equalization is achieved in addition to the intermediate and high-frequency equalization, at minimum area overhead. The prototype is realized in a 65-nm CMOS, occupying a compact active area of 0.013 mm2. The maximum equalization achieved is 21 dB at Nyquist with a measured peak-to-peak data jitter of 5.25 ps (0.17 unit interval) at 32 Gb/s for a 231 - 1 pseudorandom bit sequence signal. The measurement shows a vertical eye-opening recovery rate of up to 61% at 32 Gb/s, for a channel loss of 21 dB. The prototype exhibits a competitive power efficiency of 0.53 mW/Gb/s under a supply voltage of 1.2 V. | URI: | https://hdl.handle.net/10356/139733 | ISSN: | 1063-8210 | DOI: | 10.1109/TVLSI.2017.2771429 | Schools: | School of Electrical and Electronic Engineering | Organisations: | Integrated Circuit Design Centre of Excellence | Rights: | © 2017 IEEE. All rights reserved. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles |
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