Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/139752
Title: Enhanced field emission properties of carbon nanotube bundles confined in SiO2 pits
Authors: Lim, Yu Dian
Grapov, Dmitry
Hu, Liangxing
Kong, Qinyu
Tay, Beng Kang
Labunov, Vladimir
Miao, Jianmin
Coquet, Philippe
Aditya, Sheel
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2018
Source: Lim, Y. D., Grapov, D., Hu, L., Kong, Q., Tay, B. K., Labunov, V., . . . Aditya, S. (2018). Enhanced field emission properties of carbon nanotube bundles confined in SiO2 pits. Nanotechnology, 29(7), 075205-. doi:10.1088/1361-6528/aaa1bb
Journal: Nanotechnology
Abstract: It has been widely reported that carbon nanotubes (CNTs) exhibit superior field emission (FE) properties due to their high aspect ratios and unique structural properties. Among the various types of CNTs, random growth CNTs exhibit promising FE properties due to their reduced inter-tube screening effect. However, growing random growth CNTs on individual catalyst islands often results in spread out CNT bundles, which reduces overall field enhancement. In this study, significant improvement in FE properties in CNT bundles is demonstrated by confining them in microfabricated SiO2 pits. Growing CNT bundles in narrow (0.5 μm diameter and 2 μm height) SiO2 pits achieves FE current density of 1-1.4 A cm-2, which is much higher than for freestanding CNT bundles (76.9 mA cm-2). From the Fowler Nordheim plots, confined CNT bundles show a higher field enhancement factor. This improvement can be attributed to the reduced bundle diameter by SiO2 pit confinement, which yields bundles with higher aspect ratios. Combining the obtained outcomes, it can be conclusively summarized that confining CNTs in SiO2 pits yields higher FE current density due to the higher field enhancement of confined CNTs.
URI: https://hdl.handle.net/10356/139752
ISSN: 0957-4484
DOI: 10.1088/1361-6528/aaa1bb
Rights: © 2018 IOP Publishing Ltd. All rights reserved. This is an author-created, un-copyedited version of an article accepted for publication in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The definitive publisher authenticated version is available online at https://doi.org/10.1088/1361-6528/aaa1bb
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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