Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/139752
Title: | Enhanced field emission properties of carbon nanotube bundles confined in SiO2 pits | Authors: | Lim, Yu Dian Grapov, Dmitry Hu, Liangxing Kong, Qinyu Tay, Beng Kang Labunov, Vladimir Miao, Jianmin Coquet, Philippe Aditya, Sheel |
Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2018 | Source: | Lim, Y. D., Grapov, D., Hu, L., Kong, Q., Tay, B. K., Labunov, V., . . . Aditya, S. (2018). Enhanced field emission properties of carbon nanotube bundles confined in SiO2 pits. Nanotechnology, 29(7), 075205-. doi:10.1088/1361-6528/aaa1bb | Journal: | Nanotechnology | Abstract: | It has been widely reported that carbon nanotubes (CNTs) exhibit superior field emission (FE) properties due to their high aspect ratios and unique structural properties. Among the various types of CNTs, random growth CNTs exhibit promising FE properties due to their reduced inter-tube screening effect. However, growing random growth CNTs on individual catalyst islands often results in spread out CNT bundles, which reduces overall field enhancement. In this study, significant improvement in FE properties in CNT bundles is demonstrated by confining them in microfabricated SiO2 pits. Growing CNT bundles in narrow (0.5 μm diameter and 2 μm height) SiO2 pits achieves FE current density of 1-1.4 A cm-2, which is much higher than for freestanding CNT bundles (76.9 mA cm-2). From the Fowler Nordheim plots, confined CNT bundles show a higher field enhancement factor. This improvement can be attributed to the reduced bundle diameter by SiO2 pit confinement, which yields bundles with higher aspect ratios. Combining the obtained outcomes, it can be conclusively summarized that confining CNTs in SiO2 pits yields higher FE current density due to the higher field enhancement of confined CNTs. | URI: | https://hdl.handle.net/10356/139752 | ISSN: | 0957-4484 | DOI: | 10.1088/1361-6528/aaa1bb | Schools: | School of Electrical and Electronic Engineering School of Mechanical and Aerospace Engineering |
Organisations: | Centre for Micro-/Nano-electronics (NOVITAS) CNRS-International-NTU-Thales Research Alliance |
Rights: | © 2018 IOP Publishing Ltd. All rights reserved. This is an author-created, un-copyedited version of an article accepted for publication in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The definitive publisher authenticated version is available online at https://doi.org/10.1088/1361-6528/aaa1bb | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles |
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