Please use this identifier to cite or link to this item:
|Title:||Quantitative investigation on the critical thickness of the dielectric shell for metallic nanoparticles determined by the plasmon decay length||Authors:||Li, Anran
|Keywords:||Engineering::Materials||Issue Date:||2018||Source:||Li, A., Lim, X., Guo, L., & Li, S. (2018). Quantitative investigation on the critical thickness of the dielectric shell for metallic nanoparticles determined by the plasmon decay length. Nanotechnology, 29(16), 165501-. doi:10.1088/1361-6528/aaae3f||Journal:||Nanotechnology||Abstract:||Inert dielectric shells coating the surface of metallic nanoparticles (NPs) are important for enhancing the NPs' stability, biocompatibility, and realizing targeting detection, but they impair NPs' sensing ability due to the electric fields damping. The dielectric shell not only determines the distance of the analyte from the NP surface, but also affects the field decay. From a practical point of view, it is extremely important to investigate the critical thickness of the shell, beyond which the NPs are no longer able to effectively detect the analytes. The plasmon decay length of the shell-coated NPs determines the critical thickness of the coating layer. Extracting from the exponential fitting results, we quantitatively demonstrate that the critical thickness of the shell exhibits a linear dependence on the NP volume and the dielectric constants of the shell and the surrounding medium, but only with a small variation influenced by the NP shape where the dipole resonance is dominated. We show the critical thickness increases with enlarging the NP sizes, or increasing the dielectric constant differences between the shell and surrounding medium. The findings are essential for applications of shell-coated NPs in plasmonic sensing.||URI:||https://hdl.handle.net/10356/139779||ISSN:||0957-4484||DOI:||10.1088/1361-6528/aaae3f||Rights:||© 2018 IOP Publishing Ltd. All rights reserved. This is an author-created, un-copyedited version of an article accepted for publication in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The definitive publisher authenticated version is available online at https://doi.org/10.1088/1361-6528/aaae3f||Fulltext Permission:||none||Fulltext Availability:||No Fulltext|
|Appears in Collections:||MSE Journal Articles|
Updated on Mar 10, 2021
Updated on Mar 9, 2021
Updated on May 21, 2022
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.