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Title: Compensation of DC offset and scaling errors in voltage and current measurements of three-phase AC/DC converters
Authors: Trinh, Quoc Nam
Wang, Peng
Tang, Yi
Koh, Leong Hai
Choo, Fook Hoong
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2017
Source: Trinh, Q. N., Wang, P., Tang, Y., Koh, L. H., & Choo, F. H. (2018). Compensation of DC offset and scaling errors in voltage and current measurements of three-phase AC/DC converters. IEEE Transactions on Power Electronics, 33(6), 5401-5414. doi:10.1109/TPEL.2017.2734809
Journal: IEEE Transactions on Power Electronics
Abstract: The dc offset and scaling errors in the voltage and current measurements cause the injection of undesired dc and unbalanced currents into the three-phase input currents and subsequently lead to voltage ripple at the dc output voltage of the ac/dc converter. This paper proposes a compensation scheme for current measurement error where the dc offset and scaling errors in the current measurement are estimated from the voltage ripple characteristics of the dc output voltage ripple combining with simple band-pass and low-pass filters. Meanwhile, the dc offset and scaling errors in the voltage measurement can be rejected by using an advanced current controller developed with a proportional resonant plus a repetitive controller designed in the synchronous (d-q) reference frame. The proposed control algorithm is able to effectively reject the impact of both voltage and current measurement error so that the three-phase input currents are regulated to be balanced and sinusoidal with ultralow dc current component. Meanwhile, the dc output voltage is also well regulated to be pure dc with a negligibly small voltage ripple. The proposed compensation method is developed without the need of extra hardware circuit, sensor, or precise information of system parameters so that it can be considered as more cost effective and robust solution. The effectiveness of the proposed solution is verified by experimental results.
ISSN: 0885-8993
DOI: 10.1109/TPEL.2017.2734809
Rights: © 2017 IEEE. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
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