Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/140316
Title: Modification of structural and magnetic properties of masked Co-Pt films induced by high-energy ion implantation
Authors: Kumar, Durgesh
Gupta, Surbhi
Jin, Tianli
Razia Nongjai
Asokan, Kandasami
Piramanayagam, S. N.
Keywords: Science::Physics
Issue Date: 2017
Source: Kumar, D., Gupta, S., Jin, T., Razia Nongjai, Asokan, K., & Piramanayagam, S. N. (2018). Modification of structural and magnetic properties of masked Co-Pt films induced by high-energy ion implantation. IEEE Magnetics Letters, 9, 4500305-. doi:10.1109/LMAG.2017.2768324
Journal: IEEE Magnetics Letters
Abstract: Magnetic and structural properties of Co80Pt20 films were modified by controlled ion implantation through a dot-patterned mask for possible application in the mass production of patterned recording media. The dot patterns were fabricated using self-assembly of di-block copolymers. The effects of 14N+ and 40Ar+ ion implantation at energies as high as 40 and 100 keV, respectively, were studied. Although both ions cause changes in the structural and magnetic properties, 40 Ar+ ion implantation leads to more significant changes. The structural changes, predicted using simulations and experimentally observed using X-ray diffraction, indicate a mixing of Co into the layers below, leading to layers richer in Pt at the top. Magnetic force microscopy measurements show an increase in domain width and domain wall thickness as a function of ion fluences. The results are analyzed with measurements of magnetic anisotropy constant and micromagnetic simulations.
URI: https://hdl.handle.net/10356/140316
ISSN: 1949-307X
DOI: 10.1109/LMAG.2017.2768324
Rights: © 2017 IEEE. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:SPMS Journal Articles

SCOPUSTM   
Citations 20

3
Updated on Mar 2, 2021

PublonsTM
Citations 50

1
Updated on Mar 6, 2021

Page view(s)

80
Updated on Jan 19, 2022

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.