Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/140501
Title: Robust circuit parameters design for the CLLC-type DC transformer in the hybrid AC-DC microgrid
Authors: Huang, Jingjing
Zhang, Xin
Shuai, Zhikang
Zhang, Xinan
Wang, Peng
Koh, Leong Hai
Xiao, Jianfang
Tong, Xiangqian
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2018
Source: Huang, J., Zhang, X., Shuai, Z., Zhang, X., Wang, P., Koh, L. H., . . . Tong, X. (2019). Robust circuit parameters design for the CLLC-type DC transformer in the hybrid AC-DC microgrid. IEEE Transactions on Industrial Electronics, 66(3), 1906-1918. doi:10.1109/TIE.2018.2835373
Journal: IEEE Transactions on Industrial Electronics
Abstract: CLLC-type dc transformer (CLLC-DCT) is very popular in the hybrid ac-dc microgrid thanks to its high-power density advantage and good bidirectional power transfer capacity. In the hybrid ac/dc microgrid, the open-loop control is always utilized by the CLLC-DCT to cooperate with the bidirectional interlinking converter to realize the power and voltage conversion between the ac and dc bus. This paper first studies the circuit parameters design of the open-loop controlled CLLC-DCT with consideration of such a realistic problem: The real inductors/capacitors values are actually different with their theoretically designed values due to the operation power and temperature variation. To solve this problem, a robust circuit parameters design scheme is proposed for the CLLC-DCT in this paper. With the proposed scheme, the designed CLLC-DCT exhibits good power transmission and voltage regulation ability in the hybrid ac/dc microgrid even when its actual inductors/capacitors values vary with the practical power and temperature. The robust design method is experimentally verified in a hybrid ac/dc microgrid prototype.
URI: https://hdl.handle.net/10356/140501
ISSN: 0278-0046
DOI: 10.1109/TIE.2018.2835373
Rights: © 2018 IEEE. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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