Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/140621
Title: Continuous-flow trapping and localized enrichment of micro- and nano-particles using induced-charge electrokinetics
Authors: Zhao, Cunlu
Yang, Chun
Keywords: Engineering::Mechanical engineering
Issue Date: 2018
Source: Zhao, C., & Yang, C. (2018). Continuous-flow trapping and localized enrichment of micro- and nano-particles using induced-charge electrokinetics. Soft Matter, 14(6), 1056-1066. doi:10.1039/c7sm01744h
Journal: Soft matter
Abstract: In this work, we report an effective microfluidic technique for continuous-flow trapping and localized enrichment of micro- and nano-particles by using induced-charge electrokinetic (ICEK) phenomena. The proposed technique utilizes a simple microfluidic device that consists of a straight microchannel and a conducting strip attached to the bottom wall of the microchannel. Upon application of the electric field along the microchannel, the conducting strip becomes polarized to introduce two types of ICEK phenomena, the ICEK flow vortex and particle dielectrophoresis, and they are identified by a theoretical model formulated in this study to be jointly responsible for the trapping of particles over the edge of the conducting strip. Our experiments showed that successful trapping requires an AC/DC combined electric field: the DC component is mainly to induce electroosmotic flow for transporting particles to the trapping location; the AC component induces ICEK phenomena over the edge of the conducting strip for particle trapping. The performance of the technique is examined with respect to the applied electric voltage, AC frequency and the particle size. We observed that the trapped particles form a narrow band (nearly a straight line) defined by the edge of the conducting strip, thereby allowing localized particle enrichment. For instance, we found that under certain conditions a high particle enrichment ratio of 200 was achieved within 30 seconds. We also demonstrated that the proposed technique was able to trap particles from several microns down to several tens of nanometer. We believe that the proposed ICEK trapping would have great flexibility that the trapping location can be readily varied by controlling the location of the patterned conducting strip and multiple-location trapping can be expected with the use of multiple conducting strips.
URI: https://hdl.handle.net/10356/140621
ISSN: 1744-683X
DOI: 10.1039/c7sm01744h
Rights: © 2018 The Royal Society of Chemistry. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:MAE Journal Articles

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