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https://hdl.handle.net/10356/140808
Title: | Reducing the interfacial defect density of CZTSSe solar cells by Mn substitution | Authors: | Lie, Stener Tan, Joel Ming Rui Li, Wenjie Leow, Shin Woei Tay, Ying Fan Bishop, Douglas M. Gunawan, Oki Wong, Lydia Helena |
Keywords: | Chemistry Engineering |
Issue Date: | 2018 | Source: | Lie, S., Tan, J. M. R., Li, W., Leow, S. W., Tay, Y. F., Bishop, D. M., Gunawan, O. & Wong, L. H. (2018). Reducing the interfacial defect density of CZTSSe solar cells by Mn substitution. Journal of Materials Chemistry A, 6(4), 1540-1550. https://dx.doi.org/10.1039/c7ta09668b | Journal: | Journal of Materials Chemistry A | Abstract: | Cation disorder which arises from the size and chemical environment similarity of Cu and Zn is the limiting factor in Cu2ZnSnSxSe4−x (CZTSSe) performance. Cation substitution is one effective way to solve this issue, however, the most commonly reported substitutes, Ag and Cd, are not ideal as they detract from the earth-abundant and non-toxic motivation of CZTSSe. Mn is a promising candidate in comparison with other candidates (e.g. Fe, Ni or Co), because of its oxidation state stability and larger ionic size mismatch with Cu. In this study, Cu2MnxZn1−xSn(S,Se)4 (CMZTSSe) thin film solar cells were prepared by chemical spray pyrolysis and a subsequent selenization process. We study the influence of Mn substitution on the morphological, structural, optical, electrical and device properties. A distinct phase transformation from CZTSSe kesterite to C(M,Z)TSSe stannite is observed at 20% Mn substitution. A high amount of Mn substitution (x ≥ 0.6) is shown to increase the carrier density significantly which introduces more defects and non-radiative carrier recombination as shown by quenched photoluminescence intensity. Consequently, reduction in device performance is observed for these samples. The highest power conversion efficiency is achieved at x ≈ 0.05 with η = 7.59%, Voc = 0.43 V, Jsc = 28.9 mA cm−2 and FF = 61.03%. The improved open circuit voltage (Voc) and fill factor (FF) are attributed to the improved shunt resistance and carrier transport due to low defect density especially at the CdS/CMZTSSe interface. Finally, based on our electrical characterization, a few suggestions to improve the efficiency are proposed. | URI: | https://hdl.handle.net/10356/140808 | ISSN: | 2050-7488 | DOI: | 10.1039/c7ta09668b | DOI (Related Dataset): | https://doi.org/10.21979/N9/CMBI4U | Schools: | School of Materials Science and Engineering | Rights: | © 2018 The Royal Society of Chemistry. All rights reserved. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | MSE Journal Articles |
Files in This Item:
File | Description | Size | Format | |
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2018-JMCA-CMnZTSSe-Stener_proof.pdf | 1.07 MB | Adobe PDF | ![]() View/Open | |
2018-JMCA-CMnZTSSe-Stener_SI.pdf | 2.22 MB | Adobe PDF | ![]() View/Open |
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