Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/141533
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dc.contributor.authorWang, Qinen_US
dc.contributor.authorYu, Pengen_US
dc.contributor.authorHuang, Xiangweien_US
dc.contributor.authorFan, Jieen_US
dc.contributor.authorJing, Xiunianen_US
dc.contributor.authorJi, Zhongqingen_US
dc.contributor.authorLiu, Zhengen_US
dc.contributor.authorLiu, Guangtongen_US
dc.contributor.authorYang, Changlien_US
dc.contributor.authorLu, Lien_US
dc.date.accessioned2020-06-09T03:23:50Z-
dc.date.available2020-06-09T03:23:50Z-
dc.date.issued2018-
dc.identifier.citationWang, Q., Yu, P., Huang, X., Fan, J., Jing, X., Ji, Z., . . . Lu, L. (2018). Observation of weak anti-localization and electron-electron interaction on few-layer 1T′-MoTe2 thin films. Chinese Physics Letters, 35(7), 077303-. doi:10.1088/0256-307x/35/7/077303en_US
dc.identifier.issn0256-307Xen_US
dc.identifier.urihttps://hdl.handle.net/10356/141533-
dc.description.abstractElectronic transports of few-layer 1T'-MoTe2 films are measured at temperatures down to 0.26 K. The lowtemperature conductivity exhibits logarithmic temperature dependence and negative magneto response. The negative magnetoconductivity can be well fitted by the two-dimensional weak anti-localization theory taking a single channel of electrons into account, with the parameters α ≈ -0.5 and lφ ∝ T-0.5. The logarithmic temperature dependence has a positive slope κ ≈ 0.75, indicating the dominance of electron-electron interaction over the weak anti-localization effect, with an apparently negative Coulomb screening factor F that demands future work for clarification.en_US
dc.description.sponsorshipNRF (Natl Research Foundation, S’pore)en_US
dc.language.isoenen_US
dc.relation.ispartofChinese Physics Lettersen_US
dc.rights© 2018 Chinese Physical Society and IOP Publishing Ltd. All rights reserved.en_US
dc.subjectEngineering::Materialsen_US
dc.titleObservation of weak anti-localization and electron-electron interaction on few-layer 1T′-MoTe2 thin filmsen_US
dc.typeJournal Articleen
dc.contributor.schoolSchool of Materials Science and Engineeringen_US
dc.identifier.doi10.1088/0256-307X/35/7/077303-
dc.identifier.scopus2-s2.0-85051220261-
dc.identifier.issue7en_US
dc.identifier.volume35en_US
dc.subject.keywordsThin Filmen_US
dc.subject.keywordsAnti-localizationen_US
item.fulltextNo Fulltext-
item.grantfulltextnone-
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