Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/141605
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dc.contributor.authorGe, Xinglaien_US
dc.contributor.authorPu, Junkaien_US
dc.contributor.authorGou, Binen_US
dc.contributor.authorLiu, Yong-Chaoen_US
dc.date.accessioned2020-06-09T07:22:20Z-
dc.date.available2020-06-09T07:22:20Z-
dc.date.issued2017-
dc.identifier.citationGe, X., Pu, J., Gou, B., & Liu, Y.-C. (2018). An open-circuit fault diagnosis approach for single-phase three-level neutral-point-clamped converters. IEEE Transactions on Power Electronics, 33(3), 2559-2570. doi:10.1109/TPEL.2017.2691804en_US
dc.identifier.issn0885-8993en_US
dc.identifier.urihttps://hdl.handle.net/10356/141605-
dc.description.abstractThis paper presents a model-based open-circuit fault diagnosis approach for single-phase three-level neutral-point-clamped (3LNPC) converters in electric railway application. The diagnosis algorithm, which only requires the signals existing in the control system, not only detects open-circuit faults but also identifies the faulty device among the transistors and clamping diodes. The mixed logical dynamic (MLD) model of the converter is built to estimate the grid current. The residual generated from the measured current subtracting the estimated one is analyzed under different open-circuit faults. According to the characteristics of the residual changing rate, the proposed approach allows fault localization. The proposed method is effective both in traction and regenerative braking operation and has fast diagnosis speed. Hardware-in-the-loop (HIL) experiments are carried out to verify the effectiveness of the proposed fault diagnosis algorithm.en_US
dc.language.isoenen_US
dc.relation.ispartofIEEE Transactions on Power Electronicsen_US
dc.rights© 2017 IEEE. All rights reserved.en_US
dc.subjectEngineering::Electrical and electronic engineeringen_US
dc.titleAn open-circuit fault diagnosis approach for single-phase three-level neutral-point-clamped convertersen_US
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doi10.1109/TPEL.2017.2691804-
dc.identifier.scopus2-s2.0-85038898065-
dc.identifier.issue3en_US
dc.identifier.volume33en_US
dc.identifier.spage2559en_US
dc.identifier.epage2570en_US
dc.subject.keywordsFault Diagnosisen_US
dc.subject.keywordsMixed Logical Dynamic (MLD)en_US
item.fulltextNo Fulltext-
item.grantfulltextnone-
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