Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/142052
Title: | High-quality face image generated with conditional boundary equilibrium generative adversarial networks | Authors: | Huang, Bin Chen, Weihai Wu, Xingming Lin, Chun-Liang Suganthan, Ponnuthurai Nagaratnam |
Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2018 | Source: | Huang, B., Chen, W., Wu, X., Lin, C.-L., & Suganthan, P. N. (2018). High-quality face image generated with conditional boundary equilibrium generative adversarial networks. Pattern Recognition Letters, 111, 72-79. doi:10.1016/j.patrec.2018.04.028 | Journal: | Pattern Recognition Letters | Abstract: | We propose a novel single face image super-resolution method, which is named Face Conditional Generative Adversarial Network (FCGAN), based on boundary equilibrium generative adversarial networks. Without taking any prior facial information, our approach combines the pixel-wise L1 loss and GAN loss to optimize our super-resolution model and to generate a high-quality face image from a low-resolution one robustly (with upscaling factor 4 ×). Additionally, Compared with existing peer researches, both training and testing phases of FCGAN are end-to-end pipeline without pre/post-processing. To enhance the convergence speed and strengthen feature propagation, the Generator and Discriminator networks are designed with a skip-connection architecture, and both using an auto-encoder structure. Quantitative experiments demonstrate that our model achieves competitive performance compared with the state-of-the-art models based on both visual quality and quantitative criterions. We believe this high-quality face image generated method can impact many applications in face identification and intelligent monitor. | URI: | https://hdl.handle.net/10356/142052 | ISSN: | 0167-8655 | DOI: | 10.1016/j.patrec.2018.04.028 | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2018 Elsevier B.V. All rights reserved. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles |
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