Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/142274
Title: Sensitivity enhanced refractive index sensor by reducing the influence of in-plane wavevector in photonic spin Hall effect
Authors: Sheng, Lijuan
Xie, Linguo
Luo, Huiling
Zhou, Xinxing
Ling, Xiaohui
Zhang, Zhiyou
Keywords: Science::Physics
Issue Date: 2018
Source: Sheng, L., Xie, L., Luo, H., Zhou, X., Ling, X., & Zhang, Z. (2018). Sensitivity enhanced refractive index sensor by reducing the influence of in-plane wavevector in photonic spin Hall effect. IEEE Photonics Journal, 10(5), 6501209-. doi:10.1109/JPHOT.2018.2873213
Journal: IEEE Photonics Journal
Abstract: Photonic spin Hall effect (SHE) can be an effective sensor for determining the refractive index (RI) variation of a sensing medium. How to further improve its sensitivity is a very interesting and important issue. In this paper, we theoretically propose a weak measurement method for enhancing the sensitivity of the photonic SHE-based RI sensor by reducing the influence of the in-plane wavevector. Of particular interest, our results indicate that the sensitivity of the presented configuration reaches about 3.16 × 10-7 RIU/μ m which shows nearly two orders of magnitude improvement compared with the conventional one. Remarkably, this method can be applied for wide range of RI variation of the sensing medium while keeping the high sensitivity.
URI: https://hdl.handle.net/10356/142274
ISSN: 1943-0655
DOI: 10.1109/JPHOT.2018.2873213
Schools: School of Physical and Mathematical Sciences 
Rights: © 2018 IEEE. This journal is 100% open access, which means that all content is freely available without charge to users or their institutions. Articles accepted before 12 June 2019 were published under a CC BY 3.0 or the IEEE Open Access Publishing Agreement license. Questions about copyright policies or reuse rights may be directed to the IEEE Intellectual Property Rights Office at +1-732-562-3966 or copyrights@ieee.org.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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