Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/142507
Title: | A calibration-free/DEM-free 8-bit 2.4-GS/s single-core digital-to-analog converter with a distributed biasing scheme | Authors: | Juanda Shu, Wei Chang, Joseph Sylvester |
Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2018 | Source: | Juanda, Shu, W., & Chang, J. S. (2018). A calibration-free/DEM-free 8-bit 2.4-GS/s single-core digital-to-analog converter with a distributed biasing scheme. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 26(11), 2299-2309. doi:10.1109/TVLSI.2018.2850919 | Journal: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems | Abstract: | This paper describes a calibration-free/dynamic-element-matching-free 8-bit 2.4-GS/s single-core current-steering digital-to-analog converter (CS-DAC) featuring an integral nonlinearity of ±0.097 LSB (equivalent to 11-bit accuracy), a differential nonlinearity of 0.15/-0.05 LSB, a spurious-free dynamic range of >47.8 dB across the Nyquist bandwidth of 1.13 GHz, and a power dissipation of 26.4 mW from 1.2-/2-V supplies. These attributes are achieved by our proposed distributed biasing scheme, which largely decouples two critical tradeoffs in the CS-DAC - the tradeoff between the output impedance of the current sources and their current mismatches and that between the current mismatches and the timing errors. To simplify the CS-DAC measurements and hence reduced costs associated with testing during manufacturing, we propose a custom built-in × 2.4-Gb/s digital pattern generator (DPG) featuring low I/O pin count, no high-speed data I/O circuits, and low hardware complexity/size. The proposed 8-bit 2.4-GS/s CS-DAC with the built-in DPG is realized using a commercial 65-nm low-power CMOS process. | URI: | https://hdl.handle.net/10356/142507 | ISSN: | 1063-8210 | DOI: | 10.1109/TVLSI.2018.2850919 | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2018 IEEE. All rights reserved. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles |
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