Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/142646
Title: A comprehensive evaluation of power delivery schemes for modern microprocessors
Authors: Haj-Yahya, Jawad
Rotem, Efraim
Mendelson, Avi
Chattopadhyay, Anupam
Keywords: Engineering::Computer science and engineering
Issue Date: 2019
Source: Haj-Yahya, J., Rotem, E., Mendelson, A., & Chattopadhyay, A. (2019). A comprehensive evaluation of power delivery schemes for modern microprocessors. Proceedings of the 20th International Symposium on Quality Electronic Design (ISQED), 123-130. doi:10.1109/ISQED.2019.8697544
Abstract: The continuous quest for energy-efficient computing has led towards the adoption of fine-grained controls in processor sub-systems, of which power delivery network is the most prominent one. Recent industry trends reflect a shift towards on-chip, integrated voltage regulator (IVRs) to that effect. We undertake a thorough and quantitative evaluation of different power delivery networks for modern microprocessors. In contrast to the current trend, we conclude that IVR schemes perform worse compared to the conventional off-chip voltage regulator scheme. Further, we present studies on diverse workloads and Thermal Design Points (TDPs) to highlight the importance of workload-specific power delivery scheme. To the best of our knowledge, this is the first comprehensive study across processors' TDPs and workloads.
URI: https://hdl.handle.net/10356/142646
ISBN: 978-1-7281-0393-8
DOI: 10.1109/ISQED.2019.8697544
Rights: © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/ISQED.2019.8697544.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Conference Papers

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