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Title: Long working distance high resolution reflective sample imaging via structured embedded speckle illumination
Authors: Haridas, Aswin
Perinchery, Sandeep Menon
Shinde, Anant
Buchnev, Oleksandr
Murukeshan, Vadakke Matham
Keywords: Engineering::Mechanical engineering
Issue Date: 2020
Source: Haridas, A., Perinchery, S. M., Shinde, A., Buchnev, O., & Murukeshan, V. M. (2020). Long working distance high resolution reflective sample imaging via structured embedded speckle illumination. Optics and Lasers in Engineering, 134, 106296-. doi:10.1016/j.optlaseng.2020.106296
Journal: Optics and Lasers in Engineering
Abstract: Imaging beyond the diffraction limit at longer working distances using enhanced microscopic configurations has always been a challenge for biological and engineering samples. Even though multiple techniques have been widely used for sub-diffraction limit resolution imaging, the achievable resolution was relying on the use of objective lenses with a high numerical aperture (NA). In the case of engineering samples, in addition to sustaining higher resolutions at large working distances, improving the signal-to-noise ratio (SNR) is also critical. In this context, we propose and demonstrate a concept for high-resolution imaging at large working distances, termed as structured illumination embedded speckle microscopy. An imaging resolution of ~ 310 ± 5 nm was achieved with a microscope objective (0.55 NA; 50X) having 11 mm long working distance using a Siemen's star as the test sample. The demonstrated microscopy is therefore envisaged for engineering applications that demands high-resolution, high SNR imaging at long working distances.
ISSN: 0143-8166
DOI: 10.1016/j.optlaseng.2020.106296
Rights: © 2020 Elsevier Ltd. All rights reserved. This paper was published in Optics and Lasers in Engineering and is made available with permission of Elsevier Ltd.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Journal Articles

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