Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/144134
Title: A system health indicator for the distributed minority and majority voting based redundancy scheme
Authors: Balasubramanian, Padmanabhan
Maskell, Douglas
Prasad, Krishnamachar
Keywords: Engineering::Computer science and engineering::Hardware
Engineering::Electrical and electronic engineering::Integrated circuits
Issue Date: 2018
Source: Balasubramanian, P., Maskell, D., & Prasad, K. (2018). A system health indicator for the distributed minority and majority voting based redundancy scheme. 2018 IEEE Region 10 Conference (TENCON), 0530-0535. doi:10.1109/TENCON.2018.8650507
Project: MOE2017-T2-1-002
RG132/16
Abstract: The distributed minority and majority voting-based redundancy (DMMR) scheme was proposed as an efficient alternative to the conventional N-modular redundancy (NMR) scheme for the design of mission and safety-critical circuits and systems. However, only a basic implementation of the DMMR scheme was considered with no provision for indicating any fault or error in the DMMR system when they might occur. In this context, this paper presents the novel design of a generic system health indicator (SHI) for the DMMR scheme. Compared to the basic DMMR system, the DMMR system with the proposed SHI can provide concurrent information about the state of the system, i.e., whether the system is healthy or not. This helps to improve the observability of the DMMR system which could be useful during the online testing and/or troubleshooting of any faulty zones in the system, pre-emptively or during any scheduled maintenance. Example DMMR systems and their corresponding NMR systems without and with SHI have been implemented using a 32/28nm CMOS process and compared. On average, the DMMR systems with the proposed SHI report 6.5× improvement in a normalized figure of merit compared to the corresponding NMR systems incorporating SHI.
URI: https://hdl.handle.net/10356/144134
ISBN: 978-1-5386-5457-6
DOI: 10.1109/TENCON.2018.8650507
Rights: © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/TENCON.2018.8650507
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Conference Papers

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