Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/144723
Title: Improved microwave dielectric properties of CaMgSi2O6 ceramics through CuO doping
Authors: Lai, Yuanming
Su, Hua
Wang, Gang
Tang, Xiaoli
Liang, Xiaofeng
Huang, Xin
Li, Yuanxun
Zhang, Huaiwu
Ye, Chen
Wang, Renshaw Xiao
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2019
Source: Lai, Y., Su, H., Wang, G., Tang, X., Liang, X., Huang, X., . . . Wang, R. X. (2019). Improved microwave dielectric properties of CaMgSi2O6 ceramics through CuO doping. Journal of Alloys and Compounds, 772, 40–48. doi:10.1016/j.jallcom.2018.09.059
Journal: Journal of Alloys and Compounds
Abstract: High-performance dielectric materials for microwave communication requires low dielectric constants (εr < 10), high quality factor (Qf) and near-zero temperature coefficient of resonance frequency (τf). However, CaMgSi2O6 ceramics typically exhibit low Qf and largely negative τf, despite its low εr. In this study, nominal composition CaMg1-xCuxSi2O6 (0 ≤ x ≤ 0.16) ceramics were synthesized via a solid-state reaction. Enhanced microwave dielectric properties were achieved in the x = 0.04 ceramic sintered at 1250 °C with εr = 7.41, Qf = 160 100 GHz (two times better than the previously reported values), and τf = −42 ppm/°C. Benefited from the optimal CuO doping, this enhancement in microwave dielectric property was realized by the contribution of order structure and the densification. Excess CuO doping, which can lead to a phase transition (from C2/c to P21/c), could degenerate the microwave dielectric properties of the CaMgSi2O6 ceramics. Considering the excellent microwave dielectric properties, the CuO-doped CaMgSi2O6 ceramic is a promising candidate material for microwave communication applications.
URI: https://hdl.handle.net/10356/144723
ISSN: 0925-8388
DOI: 10.1016/j.jallcom.2018.09.059
Rights: © 2018 Elsevier B.V. All rights reserved. This paper was published in Journal of Alloys and Compounds and is made available with permission of Elsevier B.V.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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