Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/144726
Title: Investigation and mitigation of premature bearing degradation in motor drive system
Authors: Fan, Fei
See, Kye Yak
Banda, Joseph Kiran
Liu, Xiong
Gupta, Amit Kumar
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2019
Source: Fan, F., See, K. Y., Banda, J. K., Liu, X., & Gupta, A. K. (2019). Investigation and mitigation of premature bearing degradation in motor drive system. IEEE Electromagnetic Compatibility Magazine, 8(1), 75–81. doi:10.1109/memc.2019.8681374
Journal: IEEE Electromagnetic Compatibility Magazine
Abstract: Pulse width modulated (PWM) variable frequency drives (VFDs) are commonly adopted in modern control of electro-mechanical drive systems. The use of insulated-gate bipolar transistor (IGBT) and higher switching frequencies has improved the efficiency of the motor drive systems significantly but they also cause high frequency common-mode (CM) currents in the motor bearings. Hence, new drive installations failed prematurely within months, which resulted in unnecessary downtime. Mitigation techniques such as CM filter and motor shaft grounding ring are possible solutions to prevent this kind of premature failure. In this paper, using a 5.5 kW motor drive system as a case study, the cause of bearing degradation is investigated and the various mitigation techniques are carefully evaluated.
URI: https://hdl.handle.net/10356/144726
ISSN: 2162-2264
DOI: 10.1109/MEMC.2019.8681374
Schools: School of Electrical and Electronic Engineering 
Organisations: Rolls-Royce @NTU Corporate Lab
Rights: © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/MEMC.2019.8681374.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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