Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/144765
Title: The design of clocked-comparator-based time-interval measurement circuit for pulse ToF measurement
Authors: Limi Jaya, Gibran
Chen, Shoushun
Siek, Liter
Keywords: Engineering::Electrical and electronic engineering::Electronic circuits
Issue Date: 2017
Source: Limi Jaya, G., Chen, S., & Siek, L. (2017). The design of clocked-comparator-based time-interval measurement circuit for pulse ToF measurement. IEEE Sensors Journal, 17(20), 6699-6706. doi:10.1109/JSEN.2017.2749417
Project: MOE2012-T2-2-124 (ARC 17/13)
Journal: IEEE Sensors Journal
Abstract: A clocked-comparator-based time-interval measurement approach is proposed for the measurement of the time-of-flight (ToF) of wave pulses in a threshold-crossing-detection-based pulse ToF range-finding application. As compared to the conventional TDC-based pulse ToF measurement approach, the proposed approach does not require the use of extra channels in the case where multiple echoes can be expected for every wave pulse launched. As compared to the conventional (flash) analog-to-digital converter-based pulse ToF measurement approach, the proposed approach allows for a simpler backend digital processing and does not require the comparators used in the measurement to be skew-less. Meanwhile, the approach leverages on the strength of a clocked comparator circuit, which can be designed with a very wide sampling bandwidth. A clocked-comparator-based time-interval measurement circuit with a ~7-GHz bandwidth was assembled using low cost commercial-of-the-shelf components. The measurements done using the measurement circuit agree to within 10 ps with the same measurements done using a 13-GHz, 40-GSa/s oscilloscope and are precise to within ±15 ps in terms of their 2σ range.
URI: https://hdl.handle.net/10356/144765
ISSN: 1530-437X
DOI: 10.1109/JSEN.2017.2749417
Schools: School of Electrical and Electronic Engineering 
Research Centres: VIRTUS, IC Design Centre of Excellence 
Rights: © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/JSEN.2017.2749417
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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