Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/144775
Title: A wideband variable-gain amplifier with a negative exponential generation in 40-nm CMOS technology
Authors: Dong, Yangtao
Kong, Lingshan
Boon, Chirn Chye
Liu, Zhe
Li, Chenyang
Yang, Kaituo
Zhou, Ao
Keywords: Engineering
Issue Date: 2020
Source: Dong, Y., Kong, L., Boon, C. C., Liu, Z., Li, C., Yang, K., & Zhou, A. (2020). A wideband variable-gain amplifier with a negative exponential generation in 40-nm CMOS technology. Proceedings of the 2020 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), 375-378. doi:10.1109/RFIC49505.2020.9218416
Project: Award A19D6a0053 
Conference: 2020 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)
Abstract: A wideband variable-gain amplifier (VGA) with a negative exponential generation using 40 nm CMOS technology is reported. By compensating a single-branch negative exponential generator (NEG) which features a composite of dual Taylor series, the proposed negative exponential generation further extends the dB-linear range. The measurement results show the overall VGA achieves a dB-linear range of 51 dB (-34 ~ 17dB) with a gain error less than ± 1 dB. In addition, the bandwidth is around 7 GHz under different gain settings. The core circuit draws 24.6 mA current from a 1.1 V power supply (excluding the output buffer) and occupies an active area of 0.038 mm2.
URI: https://hdl.handle.net/10356/144775
ISSN: 2375-0995
DOI: 10.1109/RFIC49505.2020.9218416
Schools: School of Electrical and Electronic Engineering 
Research Centres: VIRTUS, IC Design Centre of Excellence 
Rights: © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/RFIC49505.2020.9218416
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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