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https://hdl.handle.net/10356/145239
Title: | A 0.4-V, 0.138-fJ/cycle single-phase-clocking redundant-transition-free 24T flip-flop with change-sensing scheme in 40-nm CMOS | Authors: | Le, Van Loi Li, Juhui Chang, Alan Kim, Tony Tae-Hyoung |
Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2018 | Source: | Le, V. L., Li, J., Chang, A., & Kim, T. T.-H. (2018). A 0.4-V, 0.138-fJ/cycle single-phase-clocking redundant-transition-free 24T flip-flop with change-sensing scheme in 40-nm CMOS. | Journal: | IEEE Journal of Solid-State Circuits | Abstract: | This paper presents an extremely low-voltage and low-power single-phase-clocking redundant-transition-free flip-flop (FF), named change-sensing FF (CSFF). By utilizing a local change-sensing scheme for eliminating redundant transitions of internal clocked nodes, CSFF does not consume any dynamic power when there is no data activity. Measurement results from a test chip fabricated in 40-nm CMOS technology show that CSFF saves up to 90% power dissipation at 5% data activity without additional transistors compared to the conventional transmission-gate FF (TGFF). CSFF consumes only 0.138 fJ/cycle, which is 84% lower than that of TGFF, at 0.4 V and 10% activity. In addition to the significant improvement in power and energy efficiencies, CSFF also enhances performance and minimum operating voltage. The test chip measurement demonstrates successful operations of CSFF down to 0.19 V and the delay improvement of 37% compared to TGFF in the supply voltage range of 0.4-1 V. | URI: | https://hdl.handle.net/10356/145239 | ISSN: | 1558-173X | DOI: | 10.1109/JSSC.2018.2863946 | Rights: | © 2018 Institute of Electrical and Electronics Engineers (IEEE). All rights reserved. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles |
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