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Title: Simplified fourier series based transistor open-circuit fault location method in voltage-source inverter fed induction motor
Authors: Wu, Feng
Sun, Jianwen
Zhou, Dehong
Liu, Yang
Geng, Tao
Zhao, Jin
Keywords: Engineering::Computer science and engineering
Issue Date: 2020
Source: Wu, F., Sun, J., Zhou, D., Liu, Y., Geng, T., & Zhao, J. (2020). Simplified fourier series based transistor open-circuit fault location method in voltage-source inverter fed induction motor. IEEE Access, 8, 83953-83964. doi:10.1109/ACCESS.2020.2991744
Journal: IEEE Access 
Abstract: Transistors in three-phase voltage-source inverter often suffer from open-circuit failures due to the lifting of bonding wires caused by thermic cycling, resulting in performance degradation with ripple torque and current harmonics. Current-spectral-analysis based methods are widely applied to failure diagnosis; however, high calculation consumption and complex implementation limit their application in some real-time occasion. In this paper, a simplified Fourier series method is proposed by the product between reconstructed phase currents and reference signals. Meanwhile, a novel normalized method for DC and fundamental components of simplified Fourier series are proposed to locate twenty-one transistor open-circuit faults. Numerical results show that the proposed Fourier series method coincides with that of Fast Fourier Transform. Experimental results and the comparison with previous methods show high efficiency and merits of its application to transistor open-circuit fault location in the voltage-source inverter.
ISSN: 2169-3536
DOI: 10.1109/ACCESS.2020.2991744
Schools: School of Computer Science and Engineering 
Rights: © 2020 IEEE. This journal is 100% open access, which means that all content is freely available without charge to users or their institutions. All articles accepted after 12 June 2019 are published under a CC BY 4.0 license, and the author retains copyright. Users are allowed to read, download, copy, distribute, print, search, or link to the full texts of the articles, or use them for any other lawful purpose, as long as proper attribution is given.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Journal Articles

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