Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/145813
Title: UDhashing : physical unclonable function-based user-device hash for endpoint authentication
Authors: Zheng, Yue
Cao, Yuan
Chang, Chip-Hong
Keywords: Engineering::Electrical and electronic engineering::Integrated circuits
Issue Date: 2019
Source: Zheng, Y., Cao, Y., & Chang, C.-H. (2019). UDhashing : physical unclonable function-based user-device hash for endpoint authentication. IEEE Transactions on Industrial Electronics, 66(12), 9559-9570. doi:10.1109/TIE.2019.2893831
Project: 2018-T1-001-131, RG87/18 (S)
Journal: IEEE Transactions on Industrial Electronics
Abstract: With IT consumerization, access control to remote system by endpoint user and endpoint device is mandatory for security and privacy protection. Existing systems bind an end-user with his/her registered devices but authenticate only the user and device independently. This work presents a novel UDhashing scheme, which is capable of providing a bipartite authentication of both end-user and end-device as a whole, and mutual authentication between the endpoint and the verifier. Non-contact facial biometric is extracted as user identity and physical unclonable function (PUF) is embedded into the device to generate a device “fingerprint”. UDhashing serves as an intermediary to unify the macroscopic human biometric and microscopic silicon entropy source into a single identity. The scheme is demonstrated using measured silicon data of a diode-clamped inverter based strong PUF fabricated in 40nm 1.1V CMOS technology, and the ORL and Ext. Yale B face databases. The experimental results show that the proposed system has good authentication performance with excellent discriminability for different (challenge, user, device) tuples. Besides, the proposed system is analyzed to be resilient to several known attacks. Its reliability and authentication performance can be easily enhanced by low-cost error-correction technique without compromising security.
URI: https://hdl.handle.net/10356/145813
ISSN: 1557-9948
DOI: 10.1109/TIE.2019.2893831
Schools: School of Electrical and Electronic Engineering 
Research Centres: Centre for Integrated Circuits and Systems
Rights: © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/TIE.2019.2893831
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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