Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/145866
Title: An approximate adder with a near-normal error distribution : design, error analysis and practical application
Authors: Balasubramanian, Padmanabhan
Nayar, Raunaq
Maskell, Douglas L.
Mastorakis, Nikos E.
Keywords: Engineering::Computer science and engineering
Engineering::Electrical and electronic engineering
Issue Date: 2021
Source: Balasubramanian, P., Nayar, R., Maskell, D. L., & Mastorakis, N. E. (2021). An approximate adder with a near-normal error distribution : design, error analysis and practical application. IEEE Access, 9, 4518-4530. doi:10.1109/ACCESS.2020.3047651
Project: MOE2018-T2-2-024 
Journal: IEEE Access 
Abstract: This article presents a novel approximate adder that is design-optimized and has optimized error metrics. Optimization in design translates into optimization of the design parameters such as delay, power, and area/resources, and optimization of the error metrics points to the usefulness of the proposed approximate adder for practical applications. We refer to the proposed approximate adder that is hardware optimized and having a near-normal error distribution as HOAANED, in short. We consider the implementation of HOAANED and the other approximate adders based on ASIC and FPGA design environments. We used a Xilinx Artix-7 device for a FPGA implementation, and a 32/28-nm CMOS standard digital cell library for an ASIC based implementation. To demonstrate the practical utility of HOAANED, we considered digital image processing as a practical application and performed experimentation with many images. The quality of the images reconstructed using the approximate adders was analyzed based on the peak signal-to-noise ratio (PSNR), which is used as a qualitative figure-of-merit to assess the images. It is found that HOAANED achieves an improved PSNR in comparison with the other approximate adders for image processing, and this is achieved with HOAANED simultaneously featuring optimized design metrics and error characteristics.
URI: https://hdl.handle.net/10356/145866
ISSN: 2169-3536
DOI: 10.1109/ACCESS.2020.3047651
Schools: School of Computer Science and Engineering 
Research Centres: Hardware & Embedded Systems Lab (HESL) 
Rights: © 2020 IEEE. This journal is 100% open access, which means that all content is freely available without charge to users or their institutions. All articles accepted after 12 June 2019 are published under a CC BY 4.0 license, and the author retains copyright. Users are allowed to read, download, copy, distribute, print, search, or link to the full texts of the articles, or use them for any other lawful purpose, as long as proper attribution is given.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Journal Articles

Files in This Item:
File Description SizeFormat 
09309208.pdfPublished version5.03 MBAdobe PDFThumbnail
View/Open

SCOPUSTM   
Citations 20

24
Updated on Mar 14, 2025

Web of ScienceTM
Citations 20

18
Updated on Oct 24, 2023

Page view(s)

264
Updated on Mar 16, 2025

Download(s) 50

176
Updated on Mar 16, 2025

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.