Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/146487
Title: Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers
Authors: Moothanchery, Mohesh
Bavigadda, Viswanath
Pramanik, Manojit
Toal, Vincent
Naydenova, Izabela
Keywords: Engineering::Bioengineering
Issue Date: 2017
Source: Moothanchery, M., Bavigadda, V., Pramanik, M., Toal, V., & Naydenova, I. (2017). Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers. Optics Express, 25(9), 9647-9653. doi:10.1364/OE.25.009647
Journal: Optics Express 
Abstract: Photoinduced shrinkage occurring in photopolymer layers during holographic recording was determined by phase shifting electronic speckle pattern interferometry. Phase maps were calculated from the changes in intensity at each pixel due to the phase differences introduced between object and reference beams. Shrinkage was then obtained from the changes in phase as recording proceeded. The technique allows for whole field measurement of the dimensional changes in photopolymers during holographic recording.
URI: https://hdl.handle.net/10356/146487
ISSN: 1094-4087
DOI: 10.1364/OE.25.009647
Rights: © 2017 Optical Society of America. This is an open-access article distributed under the terms of the Creative Commons Attribution License.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCBE Journal Articles

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