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Title: Visual attention guided pixel-wise just noticeable difference model
Authors: Zeng, Zhipeng
Zeng, Huanqiang
Chen, Jing
Zhu, Jianqing
Zhang, Yun
Ma, Kai-Kuang
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2019
Source: Zeng, Z., Zeng, H., Chen, J., Zhu, J., Zhang, Y., & Ma, K.-K. (2019). Visual attention guided pixel-wise just noticeable difference model. IEEE Access, 7, 132111-132119. doi:10.1109/access.2019.2939569
Journal: IEEE Access
Abstract: The just noticeable difference (JND) models in pixel domain are generally composed of luminance adaptation (LA) and contrast masking (CM), which takes edge masking (EM) and texture masking (TM) into consideration. However, in existing pixel-wise JND models, CM is not evaluated appropriately since they overestimate the masking effect of regular oriented texture regions and neglect the visual attention characteristic of human eyes for the real image. In this work, a novel JND model in pixel domain is proposed, where orderly texture masking (OTM) for regular texture areas (also called orderly texture regions) and disorderly texture masking (DTM) for complex texture areas (also called disorderly texture regions) are presented based on the orientation complexity. Meanwhile, the visual saliency is set as the weighting factor and is incorporated into CM evaluation to enhance JND thresholds. Experimental results indicate that compared with existing relevant JND profiles, the proposed JND model tolerates more distortion in the same perceptual quality, and brings better visual perception in the same level of the injected JND-noise energy.
ISSN: 2169-3536
DOI: 10.1109/ACCESS.2019.2939569
Rights: © 2019 IEEE. This journal is 100% open access, which means that all content is freely available without charge to users or their institutions. All articles accepted after 12 June 2019 are published under a CC BY 4.0 license, and the author retains copyright. Users are allowed to read, download, copy, distribute, print, search, or link to the full texts of the articles, or use them for any other lawful purpose, as long as proper attribution is given.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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