Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/146883
Title: | Visual relationship detection with contextual information | Authors: | Li, Yugang Wang, Yongbin Chen, Zhe Zhu, Yuting |
Keywords: | Engineering::Computer science and engineering | Issue Date: | 2020 | Source: | Li, Y., Wang, Y., Chen, Z. & Zhu, Y. (2020). Visual relationship detection with contextual information. Computers, Materials and Continua, 63(3), 1575-1589. https://dx.doi.org/10.32604/CMC.2020.07451 | Journal: | Computers, Materials and Continua | Abstract: | Understanding an image goes beyond recognizing and locating the objects in it, the relationships between objects also very important in image understanding. Most previous methods have focused on recognizing local predictions of the relationships. But real-world image relationships often determined by the surrounding objects and other contextual information. In this work, we employ this insight to propose a novel framework to deal with the problem of visual relationship detection. The core of the framework is a relationship inference network, which is a recurrent structure designed for combining the global contextual information of the object to infer the relationship of the image. Experimental results on Stanford VRD and Visual Genome demonstrate that the proposed method achieves a good performance both in efficiency and accuracy. Finally, we demonstrate the value of visual relationship on two computer vision tasks: image retrieval and scene graph generation. | URI: | https://hdl.handle.net/10356/146883 | ISSN: | 1546-2218 | DOI: | 10.32604/CMC.2020.07451 | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2020 The Author(s). This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
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