Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/146960
Title: Strain-reduced micro-LEDs grown directly using partitioned growth
Authors: Lu, Shunpeng
Zhang, Yiping
Zhang, Zi-Hui
Tsai, Ping Chieh
Zhang, Xueliang
Tan, Swee Tiam
Demir, Hilmi Volkan
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2021
Source: Lu, S., Zhang, Y., Zhang, Z., Tsai, P. C., Zhang, X., Tan, S. T. & Demir, H. V. (2021). Strain-reduced micro-LEDs grown directly using partitioned growth. Frontiers in Chemistry, 9. https://dx.doi.org/10.3389/fchem.2021.639023
Project: NRF-CRP-6-2010-2
1527300025
Journal: Frontiers in Chemistry
Abstract: Strain-reduced micro-LEDs in 50 μm × 50 μm, 100 μm × 100 μm, 200 μm × 200 μm, 500 μm × 500 μm, and 1,000 μm × 1,000 μm sizes were grown on a patterned c-plane sapphire substrate using partitioned growth with the metal-organic chemical-vapor deposition (MOCVD) technique. The size effect on the optical properties and the indium concentration for the quantum wells were studied experimentally. Here, we revealed that the optical properties can be improved by decreasing the chip size (from 1,000 to 100 µm), which can correspondingly reduce the in-plane compressive stress. However, when the chip size is further reduced to 50 μm × 50 μm, the benefit of strain release is overridden by additional defects induced by the higher indium incorporation in the quantum wells and the efficiency of the device decreases. The underlying mechanisms of the changing output power are uncovered based on different methods of characterization. This work shows the rules of thumb to achieve optimal power performance for strain-reduced micro-LEDs through the proposed partitioned growth process.
URI: https://hdl.handle.net/10356/146960
ISSN: 2296-2646
DOI: 10.3389/fchem.2021.639023
Rights: © 2021 Lu, Zhang, Zhang, Tsai, Zhang, Tan and Demir. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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