Deep Learning-based image analysis framework for hardware assurance of digital integrated circuits

Abstract

We propose an Artificial Intelligence (AI)/Deep Learning (DL)-based image analysis framework for hardware assurance of digital integrated circuits (ICs). Our aim is to examine and verify various hardware information from analyzing the Scanning Electron Microscope (SEM) images of an IC. In our proposed framework, we apply DL-based methods at all essential steps of the analysis. To the best of our knowledge, this is the first such framework that makes heavy use of DL-based methods at all essential analysis steps. Further, to reduce time and effort required in model re-training, we propose and demonstrate various automated or semi-automated training data preparation methods and demonstrate the effectiveness of using synthetic data to train a model. By applying our proposed framework to analyzing a set of SEM images of a large digital IC, we prove its efficacy. Our DL-based methods are fast, accurate, robust against noise, and can automate tasks that were previously performed mainly manually. Overall, we show that DL-based methods can largely increase the level of automation in hardware assurance of digital ICs and improve its accuracy.