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Title: On the worst-case side-channel security of ECC point randomization in embedded devices
Authors: Azouaoui, Melissa
Durvaux, François
Poussier, Romain
Standaert, François-Xavier
Papagiannopoulos, Kostas
Verneuil, Vincent
Keywords: Science
Issue Date: 2020
Source: Azouaoui, M., Durvaux, F., Poussier, R., Standaert, F., Papagiannopoulos, K. & Verneuil, V. (2020). On the worst-case side-channel security of ECC point randomization in embedded devices. Progress in Cryptology - INDOCRYPT 2020, 205-227.
Abstract: Point randomization is an important countermeasure to protect Elliptic Curve Cryptography (ECC) implementations against sidechannel attacks. In this paper, we revisit its worst-case security in front of advanced side-channel adversaries taking advantage of analytical techniques in order to exploit all the leakage samples of an implementation. Our main contributions in this respect are the following: first, we show that due to the nature of the attacks against the point randomization (which can be viewed as Simple Power Analyses), the gain of using analytical techniques over simpler divide-and-conquer attacks is limited. Second, we take advantage of this observation to evaluate the theoretical noise levels necessary for the point randomization to provide strong security guarantees and compare different elliptic curve coordinates systems. Then, we turn this simulated analysis into actual experiments and show that reasonable security levels can be achieved by implementations even on low-cost (e.g. 8-bit) embedded devices. Finally, we are able to bound the security on 32-bit devices against worst-case adversaries.
DOI: 10.1007/978-3-030-65277-7_9
Rights: © 2020 Springer International Publishing AG, part of Springer Nature. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:SPMS Conference Papers

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