Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/147151
Title: A systematic side-channel evaluation of black box AES in secure MCU : architecture recovery and retrieval of PUF based secret key
Authors: Won, Yoo-Seung
Bhasin, Shivam
Keywords: Engineering::Computer science and engineering
Issue Date: 2021
Source: Won, Y. & Bhasin, S. (2021). A systematic side-channel evaluation of black box AES in secure MCU : architecture recovery and retrieval of PUF based secret key. 2021 IEEE International Symposium on Circuits and Systems (ISCAS). https://dx.doi.org/10.1109/ISCAS51556.2021.9401404
Abstract: Modern microcontrollers (MCUs) come packed with features to support rising demand of security and privacy in different applications. Features like hardware support for cryptography, trusted execution environment, memory protection, etc are widely available. In this paper, we take a deeper look into ARM Cortex M33 microcontroller designed to support critical applications like point of sale, smart home, smart factory, etc. In particular, we demonstrate architecture recovery of black box AES engine using side-channel analysis. The architecture is then exploited through side-channels to recover device intrinsic keys based on physical unclonable functions. Finally, feasibility of cross-device attacks are investigated with deep learning based side-channel attacks. Our results give a better insight into embedded AES engine available off-the shelf and allow user to design secure applications knowing such vulnerabilities at design time.
URI: https://hdl.handle.net/10356/147151
ISBN: 978-1-7281-9202-4
ISSN: 0271-4302
DOI: 10.1109/ISCAS51556.2021.9401404
Rights: © 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/ISCAS51556.2021.9401404.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:TL Conference Papers

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