Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/147414
Title: Diffusional side-channel leakage from unrolled lightweight block ciphers : a case study of power analysis on PRINCE
Authors: Yli-Mäyry, Ville
Ueno, Rei
Miura, Noriyuki
Nagata, Makoto
Bhasin, Shivam
Mathieu, Yves
Graba, Tarik
Danger, Jean-Luc
Homma, Naofumi
Keywords: Engineering::Computer science and engineering
Issue Date: 2020
Source: Yli-Mäyry, V., Ueno, R., Miura, N., Nagata, M., Bhasin, S., Mathieu, Y., Graba, T., Danger, J. & Homma, N. (2020). Diffusional side-channel leakage from unrolled lightweight block ciphers : a case study of power analysis on PRINCE. IEEE Transactions On Information Forensics and Security, 16, 1351-1364. https://dx.doi.org/10.1109/TIFS.2020.3033441
Journal: IEEE Transactions on Information Forensics and Security 
Abstract: This study investigates a new side-channel leakage observed in the inner rounds of an unrolled hardware implementation of block ciphers in a chosen-input attack scenario. The side-channel leakage occurs in the first round and it can be observed in the later inner rounds because it arises from path activation bias caused by the difference between two consecutive inputs. Therefore, a new attack that exploits the leakage is possible even for unrolled implementations equipped with countermeasures (masking and/or deglitchers that separate the circuit in terms of glitch propagation) in the round involving the leakage. We validate the existence of such a unique side-channel leakage through a set of experiments with a fully unrolled PRINCE cipher hardware, implemented on a field-programmable gate array (FPGA). In addition, we verify the validity and evaluate the hardware cost of a countermeasure for the unrolled implementation, namely the Threshold Implementation (TI) countermeasure.
URI: https://hdl.handle.net/10356/147414
ISSN: 1556-6021
DOI: 10.1109/TIFS.2020.3033441
Research Centres: Temasek Laboratories @ NTU 
Rights: © 2020 The Author(s). Published by Institute of Electrical and Electronics Engineers (IEEE). This work is licensed under a Creative Commons Attribution 4.0 License.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:TL Journal Articles

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