Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/148617
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dc.contributor.authorWong, Chak Lamen_US
dc.date.accessioned2021-05-07T13:28:28Z-
dc.date.available2021-05-07T13:28:28Z-
dc.date.issued2021-
dc.identifier.citationWong, C. L. (2021). Hardware automated test system (HATS). Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/148617en_US
dc.identifier.urihttps://hdl.handle.net/10356/148617-
dc.description.abstractAs the world is transforming into a smart era, the use of smart devices is rapidly increasing. This phenomenon is known as digitalization, where information in the real world is digitalized to be interpreted by machines. The Internet of Things (IoT) is a recent communication paradigm that connects edge devices to the internet. These edge devices are responsible for retrieve and manipulate data. They are often in a form an embedded or standalone device, such as smart phones we carry every day or sensors that are deployed around us. These edge devices are typically designed specifically for different use cases, for example, a system that can measure human activity across certain areas, or sensors that is able to measure the weather condition across in a cluster. Furthermore, edge devices are also embedded in our daily lives, from small things like smart wearables, to stationary devices like smart television. As a result, there is a demand for developing such custom edge devices to enhance the rapid growth of digitalization and IoT. These devices can be categorised two types: first, outdoor devices used in open areas, and second, consumer electronic products. Thus, such devices must withstand extreme outdoor condition such as rain and storms or tampered proof against all types of daily users. Given the complexity and production volume of such devices is growing in the recent years, validation and testing became a crucial step in the hardware development such all functionality and safety of the device are ensured. Testing often requires time and effort for complex systems. Therefor automation the key solution to increase the efficiency of such processes.en_US
dc.language.isoenen_US
dc.publisherNanyang Technological Universityen_US
dc.relationSCSE20-0245en_US
dc.subjectEngineering::Computer science and engineeringen_US
dc.titleHardware automated test system (HATS)en_US
dc.typeFinal Year Project (FYP)en_US
dc.contributor.supervisorKong Wai-Kin Adamsen_US
dc.contributor.schoolSchool of Computer Science and Engineeringen_US
dc.description.degreeBachelor of Engineering (Computer Engineering)en_US
dc.contributor.organizationGovtechen_US
dc.contributor.supervisor2Petrus Laien_US
dc.contributor.supervisoremailAdamsKong@ntu.edu.sgen_US
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Appears in Collections:SCSE Student Reports (FYP/IA/PA/PI)
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HATS_Wong_Chak_Lam.pdf
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Report2.63 MBAdobe PDFView/Open
HATS - Hardware Diagram_V3.pdf
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Hardware Diagram558.37 kBAdobe PDFView/Open
HATS.PDF
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Schematics Diagram1.15 MBAdobe PDFView/Open

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