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Title: Hardware automated test system (HATS)
Authors: Wong, Chak Lam
Keywords: Engineering::Computer science and engineering
Issue Date: 2021
Publisher: Nanyang Technological University
Source: Wong, C. L. (2021). Hardware automated test system (HATS). Final Year Project (FYP), Nanyang Technological University, Singapore.
Project: SCSE20-0245
Abstract: As the world is transforming into a smart era, the use of smart devices is rapidly increasing. This phenomenon is known as digitalization, where information in the real world is digitalized to be interpreted by machines. The Internet of Things (IoT) is a recent communication paradigm that connects edge devices to the internet. These edge devices are responsible for retrieve and manipulate data. They are often in a form an embedded or standalone device, such as smart phones we carry every day or sensors that are deployed around us. These edge devices are typically designed specifically for different use cases, for example, a system that can measure human activity across certain areas, or sensors that is able to measure the weather condition across in a cluster. Furthermore, edge devices are also embedded in our daily lives, from small things like smart wearables, to stationary devices like smart television. As a result, there is a demand for developing such custom edge devices to enhance the rapid growth of digitalization and IoT. These devices can be categorised two types: first, outdoor devices used in open areas, and second, consumer electronic products. Thus, such devices must withstand extreme outdoor condition such as rain and storms or tampered proof against all types of daily users. Given the complexity and production volume of such devices is growing in the recent years, validation and testing became a crucial step in the hardware development such all functionality and safety of the device are ensured. Testing often requires time and effort for complex systems. Therefor automation the key solution to increase the efficiency of such processes.
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:SCSE Student Reports (FYP/IA/PA/PI)

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Report2.63 MBAdobe PDFView/Open
HATS - Hardware Diagram_V3.pdf
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Hardware Diagram558.37 kBAdobe PDFView/Open
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Schematics Diagram1.15 MBAdobe PDFView/Open

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Updated on May 19, 2022


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