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Title: Developing a comprehensive approach to port performance assessment
Authors: Duru, Okan
Galvao, Cassia B.
Mileski, Joan
Robles, Leo Tadeu
Gharehgozli, Amir
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2020
Source: Duru, O., Galvao, C. B., Mileski, J., Robles, L. T. & Gharehgozli, A. (2020). Developing a comprehensive approach to port performance assessment. The Asian Journal of Shipping and Logistics, 36(4), 169-180.
Journal: The Asian Journal of Shipping and Logistics
Abstract: This paper investigates the port performance assessment and proposes a comprehensive framework with various perspectives as well as priority distributions of stakeholders’ expectations in port business and operations. One fundamental questions in port performance studies is how to evaluate and quantify intangible indicators on performance. There are definitely inputs and outputs, which may be measured and evaluated through conventional instruments. However, each instrument deals with a particular aspect of whole performance problem (e.g. port efficiency, port productivity,), and many of these instruments are limited to ‘measurable’ data on port management and operations. In this paper, these two common problems are put under the scope, and a comprehensive port performance assessment scheme is established by gathering various perspectives. Quality function deployment (QFD) approach is preferred to formulize the problem and define priority ratings of expectations by each stakeholder in the port domain. The framework can contribute to a broader understanding of ports as business units, its development drivers and interaction with community neighbors, and to shed light to port performance assessment considering both public and private entities.
ISSN: 2092-5212
DOI: 10.1016/j.ajsl.2020.03.001
Rights: © 2020 The Author(s). Production and hosting by Elsevier B. V. This is an open access article under the CC BY-NC-ND license (
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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