Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/149080
Title: Fault reporting mobile application
Authors: Hiew, Jin Nee
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2021
Publisher: Nanyang Technological University
Source: Hiew, J. N. (2021). Fault reporting mobile application. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/149080
Project: A1089-201
Abstract: Municipal faults are not an uncommon sight in many environments. Especially in school compound where facilities and equipment are used by a large population. It is common when the facilities or equipment are faced with downtime and it stops functioning as it is supposed to. While performing regular maintenance can help to reduce these downtimes, there are times where equipment breakdown abruptly and this will require the attention of the management. This mobile application developed will create a channel to report such faults around the campus and the issue will be brought up to the management in the instant. This application will serve the user with a few features. Its main feature is to allow the user to report a fault instantly using the application installed on the smart devices. The quick process of reporting will only require the user to snap an image of the identified fault and fill it in with informative details to allow management to identify the location of the fault. The description provided by the user will allow management to call in relevant authorities to conduct the repair work. Other feature includes a one-button call function to hook user up with the Fault Reporting Centre (FRC) to report an urgent issue that requires the immediate attention of the management. This feature eliminates the trouble of having user look up the website for the contact information of the FRC. This application will lighten the process of fault reporting for the user as well as for the management. Furthermore, with more faults being identified and reported, it will decrease the rate of downtime and create a safer environment overall.
URI: https://hdl.handle.net/10356/149080
Schools: School of Electrical and Electronic Engineering 
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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