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Title: IEMI risk analysis for IoT-based devices
Authors: Ong, Han Jie
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2021
Publisher: Nanyang Technological University
Source: Ong, H. J. (2021). IEMI risk analysis for IoT-based devices. Final Year Project (FYP), Nanyang Technological University, Singapore.
Project: A2183-201
Abstract: Concepts on the impact IEMI can have on IoT devices
Fulltext Permission: restricted
Fulltext Availability: With Fulltext
Appears in Collections:EEE Student Reports (FYP/IA/PA/PI)

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