Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/149134Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ong, Han Jie | en_US |
| dc.date.accessioned | 2021-05-27T06:01:11Z | - |
| dc.date.available | 2021-05-27T06:01:11Z | - |
| dc.date.issued | 2021 | - |
| dc.identifier.citation | Ong, H. J. (2021). IEMI risk analysis for IoT-based devices. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/149134 | en_US |
| dc.identifier.uri | https://hdl.handle.net/10356/149134 | - |
| dc.description.abstract | Concepts on the impact IEMI can have on IoT devices | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Nanyang Technological University | en_US |
| dc.relation | A2183-201 | en_US |
| dc.subject | Engineering::Electrical and electronic engineering | en_US |
| dc.title | IEMI risk analysis for IoT-based devices | en_US |
| dc.type | Final Year Project (FYP) | en_US |
| dc.contributor.supervisor | See Kye Yak | en_US |
| dc.contributor.school | School of Electrical and Electronic Engineering | en_US |
| dc.description.degree | Bachelor of Engineering (Electrical and Electronic Engineering) | en_US |
| dc.contributor.supervisoremail | EKYSEE@ntu.edu.sg | en_US |
| item.grantfulltext | restricted | - |
| item.fulltext | With Fulltext | - |
| Appears in Collections: | EEE Student Reports (FYP/IA/PA/PI) | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Final Year Report - Ong Han Jie U1821454J.pdf Restricted Access | 2.32 MB | Adobe PDF | View/Open |
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