Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/149134| Title: | IEMI risk analysis for IoT-based devices | Authors: | Ong, Han Jie | Keywords: | Engineering::Electrical and electronic engineering | Issue Date: | 2021 | Publisher: | Nanyang Technological University | Source: | Ong, H. J. (2021). IEMI risk analysis for IoT-based devices. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/149134 | Project: | A2183-201 | Abstract: | Concepts on the impact IEMI can have on IoT devices | URI: | https://hdl.handle.net/10356/149134 | Schools: | School of Electrical and Electronic Engineering | Fulltext Permission: | restricted | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Student Reports (FYP/IA/PA/PI) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Final Year Report - Ong Han Jie U1821454J.pdf Restricted Access | 2.32 MB | Adobe PDF | View/Open |
Page view(s)
276
Updated on Sep 13, 2024
Download(s)
2
Updated on Sep 13, 2024
Google ScholarTM
Check
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.