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Title: Superscattering of light in refractive-index near-zero environments
Authors: Wang, Chan
Qian, Chao
Hu, Hao
Shen, Lian
Wang, Zuojia
Wang, Huaping
Xu, Zhiwei
Zhang, Baile
Chen, Hongsheng
Lin, Xiao
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2020
Source: Wang, C., Qian, C., Hu, H., Shen, L., Wang, Z., Wang, H., Xu, Z., Zhang, B., Chen, H. & Lin, X. (2020). Superscattering of light in refractive-index near-zero environments. Progress In Electromagnetics Research, 168, 15-23.
Project: MOE2018‐T2‐1‐022 (S) 
Journal: Progress In Electromagnetics Research
Abstract: Enhancing the scattering of light from subwavelength structures is of both fundamental and practical significance. While the scattering cross section from each channel cannot exceed the single-channel limit, it is recently reported that the total cross section can far exceed this limit if one overlaps the contribution from many channels. Such a phenomenon about enhancing the scattering from subwavelength structures in free space is denoted as the superscattering in some literature. However, the scatterer in practical scenarios is not always in free space but may be embedded in environments with non-unity refractive index n. The influence of environments on the superscattering remains elusive. Here the superscattering from subwavelength structures in the isotropic environment with near-zero index are theoretically investigated. Importantly, a smaller n can lead to a larger total cross section for superscattering. The underlying mechanism is that a smaller n can give rise to a larger single-channel limit. Our work thus indicates that the scattering from subwavelength structures can be further enhanced if one simultaneously maximizes the single-channel limit and the contribution from many channels.
ISSN: 1070-4698
DOI: 10.2528/PIER20070401
Rights: © 2020 The Electromagnetics Academy. This is an open-access article distributed under the terms of the Creative Commons Attribution License.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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