Please use this identifier to cite or link to this item:
|Title:||Formation of germanium (Ge) – based waveguides for infrared application||Authors:||Zhong, Jian||Keywords:||Engineering::Mechanical engineering||Issue Date:||2021||Publisher:||Nanyang Technological University||Source:||Zhong, J. (2021). Formation of germanium (Ge) – based waveguides for infrared application. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/150361||Project:||P-B049||Abstract:||Germanium-tin (Ge0.9Sn0.1) alloy is one of the complementary metal-oxide-semiconductor (CMOS) compatible materials in group-IV of the periodic table. Due to the large lattice mismatch between GeSn and Silicon (Si) substrate, the defects will generate within the GeSn layer. Currently, thin GeSn acts as a direct-band gap for near-mid infrared light source and photodetector. The report will show how to grow a high-quality single-crystalline GeSn (~1 μm) on germanium (Ge) buffer on Si substrate. The GeSn layer has low compression stress (-0.3%). A set of GeSn pedestal waveguide with a width of 1.25 μm has been fabricated. By measured the transmission power of GeSn at 3.74 μm, the results for propagation loss and bending loss are approximated to be 1.81 dB/cm and 0.19 dB/bend, respectively. Using infrared spectrometry, the GeSn waveguide is shown to have a transparency window to be longer than 25 μm.||URI:||https://hdl.handle.net/10356/150361||DOI (Related Dataset):||10.1109/JPHOT.2021.3059452||Fulltext Permission:||restricted||Fulltext Availability:||With Fulltext|
|Appears in Collections:||MAE Student Reports (FYP/IA/PA/PI)|
Files in This Item:
|FORMATION OF GERMANIUM (Ge) – BASED WAVEGUIDES FOR INFRARED APPLICATION.pdf|
|1.73 MB||Adobe PDF||View/Open|
Updated on Jul 1, 2022
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.