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|Title:||Ion-implantation-induced disorder in FePt-C thin films||Authors:||Kumar, Durgesh
Tham, Kim Kong
Piramanayagam, S. N.
|Keywords:||Science::Physics||Issue Date:||2018||Source:||Kumar, D., Gupta, S., Tham, K. K., Nongjai, R., Saito, S., Asokan, K. & Piramanayagam, S. N. (2018). Ion-implantation-induced disorder in FePt-C thin films. IEEE Transactions On Magnetics, 55(3), 2300805-. https://dx.doi.org/10.1109/TMAG.2018.2867912||Project:||RG163/15
|Journal:||IEEE Transactions on Magnetics||Abstract:||The effects of ion implantation through a mask on the structural and magnetic properties of FePt-C films were investigated. The mask pattern was fabricated using self-assembly of di-block copolymers. For implantation, high- (40 keV for 14N+ and 100 keV for 40Ar+ ) and low- (7.5 keV for 14N+ and 4.5 keV for 40Ar+ ) energy 14N+ and 40Ar+ ions were used to modify the structural and magnetic properties of these films. The X-ray diffraction and transport of ions in matter simulations were performed for understanding the structural changes due to the ion implantations. These results revealed the conversion of face-centered tetragonal phase to face-centered cubic (FCC) phase for 40Ar+ ion implantations and increase in inter-planar spacing of FCC FePt (111) planes for 14N+ ion implantations. Magnetic properties were then probed by using a vibrating sample magnetometer (VSM), torque magnetometer, and magnetic force microscopy (MFM). The results from VSM and torque magnetometer showed a change in anisotropy from out-of-plane to in-plane directions for all the implantation cases except for low-energy 40Ar+ ion implantations. The MFM images also showed an absence of stripe domains confirming the above-mentioned effects.||URI:||https://hdl.handle.net/10356/151284||ISSN:||0018-9464||DOI:||10.1109/TMAG.2018.2867912||Rights:||© 2018 IEEE. All rights reserved.||Fulltext Permission:||none||Fulltext Availability:||No Fulltext|
|Appears in Collections:||SPMS Journal Articles|
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