Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/151361
Title: Content-insensitive blind image blurriness assessment using Weibull statistics and sparse extreme learning machine
Authors: Deng, Chenwei
Wang, Shuigen
Li, Zhen
Huang, Guang-Bin
Lin, Weisi
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2019
Source: Deng, C., Wang, S., Li, Z., Huang, G. & Lin, W. (2019). Content-insensitive blind image blurriness assessment using Weibull statistics and sparse extreme learning machine. IEEE Transactions On Systems, Man, and Cybernetics: Systems, 49(3), 516-527. https://dx.doi.org/10.1109/TSMC.2017.2718180
Journal: IEEE Transactions on Systems, Man, and Cybernetics: Systems
Abstract: Most of the existing image blurriness assessment algorithms are proposed based on measuring image edge width, gradient, high-frequency energy, or pixel intensity variation. However, these methods are content sensitive with little consideration of image content variations, which causes variant estimations for images with different contents but same blurriness degrees. In this paper, a content-insensitive blind image blurriness assessment metric is developed utilizing Weibull statistics. Inspired by the property that the statistics of image gradient magnitude (GM) follows Weibull distribution, we parameterize the GM using \beta (scale parameter) and \gamma (shape parameter) of Weibull distribution. We also adopt skewness ( \eta ) to measure the asymmetry of the GM distribution. In order to reduce the influence of image content and achieve more robust performance, divisive normalization is then incorporated to moderate the \beta , \gamma , and \eta. The final image quality is predicted using a sparse extreme learning machine. Performances evaluation on the blur image subsets in LIVE, CSIQ, TID2008, and TID2013 databases demonstrate that the proposed method is highly correlated with human perception and robust with image contents. In addition, our method has low computational complexity which is suitable for online applications.
URI: https://hdl.handle.net/10356/151361
ISSN: 2168-2216
DOI: 10.1109/TSMC.2017.2718180
Rights: © 2017 IEEE. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles
SCSE Journal Articles

SCOPUSTM   
Citations 20

4
Updated on Jun 29, 2021

PublonsTM
Citations 20

3
Updated on Jun 23, 2021

Page view(s)

48
Updated on Oct 17, 2021

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.