Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/151585
Title: A new PUF based lock and key solution for secure in-field testing of cryptographic chips
Authors: Cui, Aijiao
Chang, Chip-Hong
Zhou, Wei
Zheng, Yue
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2019
Source: Cui, A., Chang, C., Zhou, W. & Zheng, Y. (2019). A new PUF based lock and key solution for secure in-field testing of cryptographic chips. IEEE Transactions On Emerging Topics in Computing, 9(2), 1095-1105. https://dx.doi.org/10.1109/TETC.2019.2903387
Project: MOE2018-T1-001-131 (RG87/18)
Journal: IEEE Transactions on Emerging Topics in Computing
Abstract: Scan-based side-channel attacks have become a new threat to cryptographic chips. Existing countermeasures require a secret test key to unlock the scan chain before in-field testing is allowed. However, test key disclosure poses tremendous risks to multiple crypto chips that share a common test key. We address this open problem of in-field testing by leveraging physical unclonable function (PUF) to make the derived test key unique to each chip. The PUF’s response is invoked only once and hardened into a one-time programmable pad. The PUF response required by the designer to derive a test key of each crypto chip can only be recovered at the time of locking the scan chains without directly reading it out. The manufacturer can test the chip normally with no test time penalty before the passed chips are locked. The proposed solution is analyzed to be secure against all known scan-based side-channel attacks and the overhead incurred for the added security is negligibly small.
URI: https://hdl.handle.net/10356/151585
ISSN: 2168-6750
DOI: 10.1109/TETC.2019.2903387
Rights: © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/TETC.2019.2903387.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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