Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/151659
Title: Deep neural network-aided Gaussian message passing detection for ultra-reliable low-latency communications
Authors: Guo, Jie
Song, Bin
Chi, Yuhao
Jayasinghe, Lahiru
Yuen, Chau
Guan, Yong Liang
Du, Xiaojiang
Guizani, Mohsen
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2019
Source: Guo, J., Song, B., Chi, Y., Jayasinghe, L., Yuen, C., Guan, Y. L., Du, X. & Guizani, M. (2019). Deep neural network-aided Gaussian message passing detection for ultra-reliable low-latency communications. Future Generation Computer Systems, 95, 629-638. https://dx.doi.org/10.1016/j.future.2019.01.041
Journal: Future Generation Computer Systems
Abstract: Ultra-reliable low-latency communications (URLLC) is a key technology in 5G supporting real-time multimedia services, which requires a low-cost signal recovery technology in the physical layer. A kind of well-known low-complexity signal detection is message passing algorithm (MPA) based on factor graph. However, reliability and robustness of MPA are deteriorated when there are cycles in factor graph. To address this issue, we propose two novel Gaussian message passing (GMP) algorithms with the aid of deep neural network (DNN), in which the network architectures consist of two DNNs associated with detections for mean and variance of the signal. Particularly, the network architecture is constructed by transforming the factor graph and message update functions of the original GMP algorithm from node-type into edge-type. Then, weights and bias parameters are assigned in the network architecture. With the aid of deep learning methods, the optimal weights and bias parameters are obtained. Numerical results demonstrate that two proposed DNN-aided GMP algorithms can significantly improve the convergence of original GMP algorithm and also achieve robust performances in the cases without prior information.
URI: https://hdl.handle.net/10356/151659
ISSN: 0167-739X
DOI: 10.1016/j.future.2019.01.041
Schools: School of Electrical and Electronic Engineering 
Rights: © 2019 Elsevier B.V. All rights reserved.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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