Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/151783
Title: Effect of capacitor voltage ripples on submodule active power control limits of cascaded multilevel converters
Authors: Liang, Gaowen
Tafti, Hossein Dehghani
Farivar, Glen G.
Pou, Josep
Townsend, Christopher D.
Konstantinou, Georgios
Ceballos, Salvador
Keywords: Engineering::Electrical and electronic engineering
Issue Date: 2021
Source: Liang, G., Tafti, H. D., Farivar, G. G., Pou, J., Townsend, C. D., Konstantinou, G. & Ceballos, S. (2021). Effect of capacitor voltage ripples on submodule active power control limits of cascaded multilevel converters. IEEE Transactions On Industrial Electronics. https://dx.doi.org/10.1109/TIE.2021.3091934
Journal: IEEE Transactions on Industrial Electronics 
Abstract: In the operation of cascaded H-bridge (CHB) converters and modular multilevel converters (MMCs) with energy storage or renewable power resources, unbalanced active power distribution among the submodules (SMs) is unavoidable. Depending on the operating conditions, there are certain upper and lower limits on the active power that can be processed by a single SM or a subset of SMs. The control system needs to restrict the SM power references to these limits, hence, accurate knowledge of the power limits is important. In existing methods to derive the power limits, the SM capacitor voltages are assumed to have negligible ripples, whereas in practice the ripples can be considerable. This paper analyzes the effect of capacitor voltage ripples on the SM active power control limits and highlights the importance of considering the ripple effect. A methodology is proposed to accurately incorporate capacitor voltage ripples in the derivation of SM active power control limits. Simulation and experimental results are provided to evaluate the effectiveness of the proposed methodology.
URI: https://hdl.handle.net/10356/151783
ISSN: 0278-0046
DOI: 10.1109/TIE.2021.3091934
Rights: © 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/TIE.2021.3091934.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles
ERI@N Journal Articles

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