Please use this identifier to cite or link to this item:
|Title:||Building an intelligent e-diagnostics system for reducing mean time to repair (MTTR) of wire bond machines||Authors:||Sunil, Bhandari
|Keywords:||DRNTU::Engineering||Issue Date:||2002||Abstract:||In today's cost driven semiconductor industry, utilizing the available capacity to its maximum limits is of prime importance for being competitive. With the equipments being expensive and the technology changing very fast, utilization of the available resources, by minimizing the repair time brings to the forefront production capacity that would have otherwise stayed hidden or lost. The other key issue that any company needs to address is that repairing complicated machines (such as wire bond) requires training of personnel and this leads to extra costs. Thus a system was felt necessary that would incorporate the breakdown diagnosis, so as to reduce MTTR. The e- diagnostics system that has been developed as a part of this project aims at making a wholesome online diagnostic tool. This e-Diagnostics system also aims to centralize the database of all the wire bonding machines, thus easing the access of information and providing key information, that would otherwise require another tool such as data mining. This system would hence provide a long-term solution to the company, as it can be mdoified to serve machines other than Wire Bonding machines.||URI:||http://hdl.handle.net/10356/15186||Fulltext Permission:||restricted||Fulltext Availability:||With Fulltext|
|Appears in Collections:||SMA Theses|
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.