Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/152288
Title: J-Park simulator : an ontology-based platform for cross-domain scenarios in process industry
Authors: Eibeck, Andreas
Lim, Mei Qi
Kraft, Markus
Keywords: Engineering::Chemical engineering
Issue Date: 2019
Source: Eibeck, A., Lim, M. Q. & Kraft, M. (2019). J-Park simulator : an ontology-based platform for cross-domain scenarios in process industry. Computers and Chemical Engineering, 131, 106586-. https://dx.doi.org/10.1016/j.compchemeng.2019.106586
Journal: Computers and Chemical Engineering
Abstract: The J-Park Simulator (JPS) acts as a continuously growing platform for integrating real-time data, knowledge, models, and tools related to process industry. It aims at simulation and optimization in cross-domain and multi-level scenarios and relies heavily on ontologies and semantic technologies. In this paper, we demonstrate the interoperability between different applications in JPS, introduce new domain ontologies into the JPS, and integrate live data. For this, we utilize a knowledge graph to store and link semantically described data and models and create agents wrapping the applications and updating the data in the knowledge graph dynamically. We present a comprehensive industrial air pollution scenario, which has been implemented as part of the JPS, to show how knowledge graphs and modular domain ontologies support the interoperability between agents. We show that the architecture of JPS increases the interoperability and flexibility in cross-domain scenarios and conclude that the potential of ontologies outweighs additional wrapping efforts.
URI: https://hdl.handle.net/10356/152288
ISSN: 0098-1354
DOI: 10.1016/j.compchemeng.2019.106586
Schools: School of Chemical and Biomedical Engineering 
Organisations: Cambridge Centre for Advanced Research and Education in Singapore (CARES)
Rights: © 2019 Elsevier Ltd. All rights reserved. This paper was published in Computers and Chemical Engineering and is made available with permission of Elsevier Ltd.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SCBE Journal Articles

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